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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">ntv</journal-id><journal-title-group><journal-title xml:lang="ru">Научно-технический вестник информационных технологий, механики и оптики</journal-title><trans-title-group xml:lang="en"><trans-title>Scientific and Technical Journal of Information Technologies, Mechanics and Optics</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2226-1494</issn><issn pub-type="epub">2500-0373</issn><publisher><publisher-name>Университет ИТМО</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.17586/2226-1494-2022-22-1-147-154</article-id><article-id custom-type="elpub" pub-id-type="custom">ntv-290</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>МАТЕМАТИЧЕСКОЕ И КОМПЬЮТЕРНОЕ МОДЕЛИРОВАНИЕ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>MODELING AND SIMULATION</subject></subj-group></article-categories><title-group><article-title>Новая аналитическая модель тока стока и параметров малых сигналов AlGaN-GaN транзисторов с высокой подвижностью электронов</article-title><trans-title-group xml:lang="en"><trans-title>A new analytical model of drain current and small signal parameters  for AlGaN-GaN high-electron-mobility transistors</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-8694-1471</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Фарти</surname><given-names>А.</given-names></name><name name-style="western" xml:lang="en"><surname>Farti</surname><given-names>A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Фарти Аззеддин — PhD, доцент</p><p>Касабланка, 20190</p></bio><bio xml:lang="en"><p>Azzeddine Farti — PhD, Associate Professor</p><p>Casablanca, 20190</p></bio><email xlink:type="simple">azzeddine.farti-etu@etu.univh2c.ma</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-8582-1884</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Тухами</surname><given-names>А.</given-names></name><name name-style="western" xml:lang="en"><surname>Touhami</surname><given-names>A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Тухами Абделькадер — D.Sc, профессор, профессор</p><p>sc 8158211000</p><p>Касабланка, 20190</p></bio><bio xml:lang="en"><p>Abdelkader Touhami — D.Sc, Full Professor</p><p>sc 8158211000</p><p>Casablanca, 20190</p></bio><email xlink:type="simple">abdelkadertouhami2016@gmail.com</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Университет Хасана II, Факультет наук Касабланки</institution><country>Марокко</country></aff><aff xml:lang="en"><institution>Hassan II University of Casablanca</institution><country>Morocco</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2022</year></pub-date><pub-date pub-type="epub"><day>17</day><month>12</month><year>2024</year></pub-date><volume>22</volume><issue>1</issue><fpage>147</fpage><lpage>154</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Фарти А., Тухами А., 2024</copyright-statement><copyright-year>2024</copyright-year><copyright-holder xml:lang="ru">Фарти А., Тухами А.</copyright-holder><copyright-holder xml:lang="en">Farti A., Touhami A.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://ntv.elpub.ru/jour/article/view/290">https://ntv.elpub.ru/jour/article/view/290</self-uri><abstract><p>Предложена новая аналитическая модель тока стока в устройствах AlGaN-GaN транзисторов с высокой подвижностью электронов (HEMT) на основе полиномиального выражения для уровня Ферми как функции концентрации носителей заряда. В ходе исследования изучено влияние паразитных сопротивлений (стороны истока и стока), высокоскоростного насыщения, количества алюминия в барьере AlGaN и низкой подвижности поля. Для выделения выходных характеристик, частоты среза и крутизны разработаны параметры гиперчастотного сигнала. Сравнение аналитических расчетов с экспериментальными измерениями подтвердило справедливость предложенной модели.</p></abstract><trans-abstract xml:lang="en"><p>The paper proposes a new analytical model of the drain current in AlGaN-GaN high-electron-mobility transistors (HEMT) on the basis of a polynomial expression for the Fermi level as a function of the concentration of charge carriers. The study investigated the influence of parasitic resistances (source and drain sides), high-speed saturation, the amount of aluminum in the AlGaN barrier, and low field mobility. To isolate the output characteristics, cut-off frequency and steepness, the parameters of the hyper frequency signal were developed. Comparison of analytical calculations with experimental measurements confirmed the validity of the proposed model.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>AlGaN-GaN</kwd><kwd>транзистор с высокой подвижностью электронов</kwd><kwd>HEMT</kwd><kwd>двумерный электронный газ</kwd><kwd>вольтамперная характеристика</kwd><kwd>частота среза</kwd><kwd>крутизна характеристики</kwd></kwd-group><kwd-group xml:lang="en"><kwd>AlGaN-GaN</kwd><kwd>HEMTs</kwd><kwd>2-DEG two-dimensional electron gas</kwd><kwd>current–voltage characteristics</kwd><kwd>cut-off frequencies</kwd><kwd>Transconductance</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">Работа выполнена на факультете наук Айн Чок Km 8, Университет Хасана II, Касабланка, Марокко.</funding-statement><funding-statement xml:lang="en">This work carried out at the Faculty of Sciences Ain Chok Km 8, Hassan II University, Casablanca, Morocco.</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Liu J., Guo Y., Zhang J., Yao J., Huang X., Huang C., Huang Z., Yang K. 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