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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">ntv</journal-id><journal-title-group><journal-title xml:lang="ru">Научно-технический вестник информационных технологий, механики и оптики</journal-title><trans-title-group xml:lang="en"><trans-title>Scientific and Technical Journal of Information Technologies, Mechanics and Optics</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2226-1494</issn><issn pub-type="epub">2500-0373</issn><publisher><publisher-name>Университет ИТМО</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.17586/2226-1494-2024-24-6-1059-1065</article-id><article-id custom-type="elpub" pub-id-type="custom">ntv-413</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>МАТЕМАТИЧЕСКОЕ И КОМПЬЮТЕРНОЕ МОДЕЛИРОВАНИЕ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>MODELING AND SIMULATION</subject></subj-group></article-categories><title-group><article-title>Исследование стабильности гибридной МОП-мемристорной памяти с использованием модифицированного метода оптимизации роя частиц</article-title><trans-title-group xml:lang="en"><trans-title>Stability study of hybrid MOS memristor memory using modified particle swarm optimization method</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-2933-9599</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Бондарев</surname><given-names>А. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Bondarev</surname><given-names>A. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Бондарев Андрей Владимирович - кандидат технических наук, доцент, заведующий кафедрой,</p><p>Уфа, 450076</p></bio><bio xml:lang="en"><p>Andrei V. Bondarev - PhD, Associate Professor, Head of Department,</p><p>Ufa, 450076</p></bio><email xlink:type="simple">bondarevav@kfosu.edu.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-5917-2910</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ефанов</surname><given-names>В. Н.</given-names></name><name name-style="western" xml:lang="en"><surname>Efanov</surname><given-names>V. N.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Ефанов Владимир Николаевич - доктор технических наук, профессор, профессор,</p><p>Уфа, 450076</p></bio><bio xml:lang="en"><p>Vladimir N. Efanov – D.Sc., Full Professor,</p><p>Ufa, 450076</p></bio><email xlink:type="simple">efanov@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Уфимский университет науки и технологий</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Ufa University of Science and Technology</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2024</year></pub-date><pub-date pub-type="epub"><day>29</day><month>12</month><year>2024</year></pub-date><volume>24</volume><issue>6</issue><fpage>1059</fpage><lpage>1065</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Бондарев А.В., Ефанов В.Н., 2024</copyright-statement><copyright-year>2024</copyright-year><copyright-holder xml:lang="ru">Бондарев А.В., Ефанов В.Н.</copyright-holder><copyright-holder xml:lang="en">Bondarev A.V., Efanov V.N.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://ntv.elpub.ru/jour/article/view/413">https://ntv.elpub.ru/jour/article/view/413</self-uri><abstract><sec><title>Введение</title><p>Введение. Рассматривается проблема оценки стабильности наноэлектронных структур, включающих гибридную транзисторно-мемристорную энергонезависимую память. Результаты исследования процессов в наноэлектронных структурах с использованием мемристоров показали, что дополнительно к обычному дрейфу параметров, свойственному полупроводниковым приборам, в данных структурах возникают новые уникальные эффекты. Такие эффекты приводят к неопределенности в оценке состояния ячеек мемристорной памяти. Исследование подобных эффектов находится в начальном состоянии, в том числе из-за отсутствия моделей, позволяющих в полном объеме исследовать изменчивость параметров и дрейф состояний мемристоров. В связи с этим предлагается использовать метаэвристический метод роя частиц, позволяющий оценивать устойчивость гибридной транзисторно-мемристорной памяти.</p></sec><sec><title>Методы</title><p>Методы. В работе используются методы топологического и параметрического анализов наноэлектронных структур с мемристорами, метод интервального анализа подобных структур, метод оптимизации роя частиц для решения интервальных алгебраических и дифференциальных уравнений.</p></sec><sec><title>Основные результаты</title><p>Основные результаты. Предложена структурно-параметрическая модель гибридного устройства памяти на основе мемристоров с учетом конечных приращений их параметров, вызванных воздействием внешних и внутренних факторов. Разработан алгоритм оценки параметров гибридного запоминающего устройства с мемристорами на основе модифицированного метода оптимизации роя частиц.</p></sec><sec><title>Обсуждение</title><p>Обсуждение. Интервальные математические модели служат основой для разработки новых принципов организации сверхплотной энергонезависимой памяти и создают предпосылки для новых подходов к организации вычислений в памяти. Вычислительный алгоритм, основанный на методе оптимизации роя частиц, позволяет оценить работоспособность гибридных металл-оксид-полупроводниковых структур (МОП-структур) с мемристорами в реальных условиях эксплуатации. В результате выполненной оценки появляется возможность расширить область применения устройств, использующих квантовые эффекты, в различных технических приложениях.</p></sec></abstract><trans-abstract xml:lang="en"><p>The problem of stability assessment of nanoelectronic structures including hybrid transistor-memristor non-volatile memory is considered. The results of the study of processes in nanoelectronic structures using memristors indicate that in addition to the usual parameter drift inherent in semiconductor devices, new unique effects arise in them, in particular, such effects that lead to uncertainty in the evaluation of the state of memristor memory cells. The study of such effects is in its infancy, in part due to the lack of models that allow full investigation of parameter variability and state drift of memristors. In this regard, we propose to use the metaheuristic particle swarm method which allows us to evaluate the stability of hybrid transistor-memristor memory. The methods of topological and parametric analysis of nanoelectronic structures with memristors, the method of interval analysis of similar structures, the method of particle swarm optimization for solving interval algebraic and differential equations are used in this work. A structuralparametric model of a hybrid memristor-based memory device is proposed, taking into account finite increments of their parameters caused by the influence of external and internal factors. An algorithm for estimating the parameters of a hybrid memristor-based memory device using a modified particle swarm optimization method is developed. Interval mathematical models serve as a basis for the development of new principles of organization of ultra-dense nonvolatile memory and create prerequisites for new approaches to the organization of computations in memory. The computational algorithm based on the method of particle swarm optimization allows us to evaluate the performance of hybrid metaloxide-semiconductor structures (MOS structures) with memristors under real operating conditions, resulting in the possibility to expand the scope of application of devices using quantum effects in various technical application.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>мемристор</kwd><kwd>МОП-транзистор</kwd><kwd>память</kwd><kwd>стабильность</kwd><kwd>оптимизация</kwd><kwd>рой частиц</kwd></kwd-group><kwd-group xml:lang="en"><kwd>memristor</kwd><kwd>MOSFET</kwd><kwd>memory</kwd><kwd>stability</kwd><kwd>optimization</kwd><kwd>swarm of particles</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Ziegler T., Brackmann L., Hennen T., Bengel C., Menzel S., Wouters D.J. 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