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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">ntv</journal-id><journal-title-group><journal-title xml:lang="ru">Научно-технический вестник информационных технологий, механики и оптики</journal-title><trans-title-group xml:lang="en"><trans-title>Scientific and Technical Journal of Information Technologies, Mechanics and Optics</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2226-1494</issn><issn pub-type="epub">2500-0373</issn><publisher><publisher-name>Университет ИТМО</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.17586/2226-1494-2024-24-6-1066-1070</article-id><article-id custom-type="elpub" pub-id-type="custom">ntv-414</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>КРАТКИЕ СООБЩЕНИЯ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>BRIEF PAPERS</subject></subj-group></article-categories><title-group><article-title>Анализ уязвимости нейросетевых моделей YOLO к атаке Fast Sign Gradient Method</article-title><trans-title-group xml:lang="en"><trans-title>Analysis of the vulnerability of YOLO neural network models to the Fast Sign Gradient Method attack</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0009-0001-3394-9883</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Тетерев</surname><given-names>Н. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Teterev</surname><given-names>N. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Тетерев Николай Валерьевич - младший научный сотрудник, Санкт-Петербург, 197022;</p><p>инженер, Санкт-Петербург, 194021</p></bio><bio xml:lang="en"><p>Nikolai V. Teterev - Junior Researcher, Saint Petersburg, 197022;</p><p>Engineer, Saint Petersburg, 194021</p></bio><email xlink:type="simple">teterevkolya21@gmail.com</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0009-0002-5839-2812</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Трифонов</surname><given-names>В. Е.</given-names></name><name name-style="western" xml:lang="en"><surname>Trifonov</surname><given-names>V. E.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Трифонов Владислав Евгеньевич - младший научный сотрудник,</p><p>Санкт-Петербург, 197022</p></bio><bio xml:lang="en"><p>Vladislav E. Trifonov - Junior Researcher,</p><p>Saint Petersburg, 197022</p></bio><email xlink:type="simple">vtr1f0nov@yandex.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0003-4421-2411</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Левина</surname><given-names>А. Б.</given-names></name><name name-style="western" xml:lang="en"><surname>Levina</surname><given-names>A. B.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Левина Алла Борисовна - кандидат физико-математических наук, доцент, доцент,</p><p>Санкт-Петербург, 197022</p></bio><bio xml:lang="en"><p>Alla B. Levina - PhD (Physica &amp; Mathematics), Associate Professor, Associate Professor,</p><p>Saint Petersburg, 197022</p></bio><email xlink:type="simple">Alla_levina@mail.ru</email><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Санкт-Петербургский государственный электротехнический университет «ЛЭТИ» им. В.И. Ульянова (Ленина);&#13;
АО «Научно-инженерный центр Санкт-Петербургского электротехнического университета»</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Saint Petersburg Electrotechnical University “LETI”;&#13;
Research &amp; Engineering Center JSC “R&amp;EC ETU”</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>Санкт-Петербургский государственный электротехнический университет «ЛЭТИ» им. В.И. Ульянова (Ленина)</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Saint Petersburg Electrotechnical University “LETI”</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2024</year></pub-date><pub-date pub-type="epub"><day>29</day><month>12</month><year>2024</year></pub-date><volume>24</volume><issue>6</issue><fpage>1066</fpage><lpage>1070</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Тетерев Н.В., Трифонов В.Е., Левина А.Б., 2024</copyright-statement><copyright-year>2024</copyright-year><copyright-holder xml:lang="ru">Тетерев Н.В., Трифонов В.Е., Левина А.Б.</copyright-holder><copyright-holder xml:lang="en">Teterev N.V., Trifonov V.E., Levina A.B.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://ntv.elpub.ru/jour/article/view/414">https://ntv.elpub.ru/jour/article/view/414</self-uri><abstract><p>Представлен анализ формализованных условий создания универсальных изображений, ложно классифицируемых алгоритмами компьютерного зрения, называемыми состязательными примерами, на нейросетевые модели YOLO. Выявлена и исследована закономерность успешного создания универсального деструктивного изображения в зависимости от сгенерированного набора данных, на котором происходило обучение нейронных сетей с помощью атаки Fast Sign Gradient Method. Указанная закономерность продемонстрирована для моделей классификатора YOLO8, YOLO9, YOLO10, YOLO11, обученных на стандартном наборе данных COCO.</p></abstract><trans-abstract xml:lang="en"><p>The analysis of formalized conditions for creating universal images falsely classified by computer vision algorithms, called adversarial examples, on YOLO neural network models is presented. The pattern of successful creation of a universal destructive image depending on the generated dataset on which neural networks were trained using the Fast Sign Gradient Method attack is identified and studied. The specified pattern is demonstrated for YOLO8, YOLO9, YOLO10, YOLO11 classifier models trained on the standard COCO dataset.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>генеративные атаки</kwd><kwd>состязательный пример</kwd><kwd>YOLO</kwd><kwd>COCO</kwd><kwd>набор данных</kwd><kwd>нейронная сеть</kwd></kwd-group><kwd-group xml:lang="en"><kwd>adversarial attacks</kwd><kwd>adversarial example</kwd><kwd>YOLO</kwd><kwd>COCO</kwd><kwd>dataset</kwd><kwd>neural network</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">Работа выполнена в рамках государственного задания Министерства науки и высшего образования Российской Федерации № 075-00003-24-01 от 08.02.2024 (проект FSEE-2024-0003).</funding-statement><funding-statement xml:lang="en">The work was performed within the framework of the state assignment of the Ministry of Science and Higher Education of the Russian Federation No. 075-00003-24-01 dated 08.02.2024 (FSEE-2024-0003 project).</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Chakraborty A., Alam M., Dey V., Chattopadhyay A., Mukhopadhyay D. 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