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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">ntv</journal-id><journal-title-group><journal-title xml:lang="ru">Научно-технический вестник информационных технологий, механики и оптики</journal-title><trans-title-group xml:lang="en"><trans-title>Scientific and Technical Journal of Information Technologies, Mechanics and Optics</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2226-1494</issn><issn pub-type="epub">2500-0373</issn><publisher><publisher-name>Университет ИТМО</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.17586/2226-1494-2025-25-6-1024-1032</article-id><article-id custom-type="elpub" pub-id-type="custom">ntv-535</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ОПТИЧЕСКИЕ СИСТЕМЫ И ТЕХНОЛОГИИ</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>OPTICAL ENGINEERING</subject></subj-group></article-categories><title-group><article-title>Новый подход к измерениям и расчетам спектральных характеристик селективных элементов оптико-электронных систем</article-title><trans-title-group xml:lang="en"><trans-title>Innovative method for measuring and calculating spectral characteristics of selective elements in optoelectronic systems</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0009-0005-6413-6411</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ильинский</surname><given-names>А. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Ilinskii</surname><given-names>A. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Александр Владимирович Ильинский, заместитель директора центра</p><p>научно-образовательный центр «Музей истории Университета ИТМО»</p><p>197101; Санкт-Петербург</p></bio><bio xml:lang="en"><p>Alexander V. Ilinskii, Vice-Director at the Center</p><p>Scientific Educational Center “ITMO University History Museum”</p><p>197101; Saint Petersburg</p></bio><email xlink:type="simple">avilinskii@itmo.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0009-0004-4515-0261</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Мальцева</surname><given-names>Н. К.</given-names></name><name name-style="western" xml:lang="en"><surname>Maltseva</surname><given-names>N. K.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Надежда Константиновна Мальцева, кандидат технических наук, директор центра</p><p>научно-образовательный центр «Музей истории Университета ИТМО»</p><p>197101; Санкт-Петербург</p><p>sc 51564440800</p></bio><bio xml:lang="en"><p>Nadezhda K. Maltseva, PhD, Director at the Center</p><p>Scientific Educational Center “ITMO University History Museum”</p><p>197101; Saint Petersburg</p><p>sc 51564440800</p></bio><email xlink:type="simple">nkmaltceva@itmo.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-7830-6841</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Раскин</surname><given-names>Е. О.</given-names></name><name name-style="western" xml:lang="en"><surname>Raskin</surname><given-names>E. O.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Евгений Олегович Раскин, директор по молодежной политике</p><p>197101; Санкт-Петербург</p><p>sc 57190605879</p></bio><bio xml:lang="en"><p>Eugene O. Raskin, Director for Youth Policy</p><p>197101; Saint Petersburg</p><p>sc 57190605879</p></bio><email xlink:type="simple">raskin@itmo.ru</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Университет ИТМО</institution><country>Россия</country></aff><aff xml:lang="en"><institution>ITMO University</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2025</year></pub-date><pub-date pub-type="epub"><day>23</day><month>12</month><year>2025</year></pub-date><volume>25</volume><issue>6</issue><fpage>1024</fpage><lpage>1032</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Ильинский А.В., Мальцева Н.К., Раскин Е.О., 2025</copyright-statement><copyright-year>2025</copyright-year><copyright-holder xml:lang="ru">Ильинский А.В., Мальцева Н.К., Раскин Е.О.</copyright-holder><copyright-holder xml:lang="en">Ilinskii A.V., Maltseva N.K., Raskin E.O.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://ntv.elpub.ru/jour/article/view/535">https://ntv.elpub.ru/jour/article/view/535</self-uri><abstract><sec><title>   Введение</title><p>   Введение. Исследованы вопросы энергетической калибровки и точных измерений спектральных характеристик элементов оптико-электронных систем, предназначенных для анализа излучения удаленных объектов. Современные методы калибровки требуют учета переменных параметров окружающей среды, особенно в инфракрасном диапазоне спектра. Это приводит к значительным погрешностям измерений и создает затруднения при проведении наземных испытаний. Сложность компенсации атмосферных эффектов, низкая точность и трудоемкость их учета при использовании классических методик приводят к значительным ошибкам и снижают качество полученных данных. Предложенный подход базируется на использовании узкоспектральных излучателей, расположенных непосредственно перед входным иллюминатором прибора, и исключает необходимость учета спектрального пропускания атмосферы.</p></sec><sec><title>   Метод</title><p>   Метод. Вместо традиционных методов, основанных на использовании эталонных источников типа «черное тело» или фотоприемников, требующих учета пропускания воздушного тракта, предлагается применять в качестве калибровочного излучателя ряд узкоспектральных (спектрозональных) потоков излучения, воздействующих на испытуемую оптико-электронную систему непосредственно в плоскости ее входного иллюминатора, что позволяет получать спектральные характеристики исследуемых элементов напрямую, минуя этап определения пропускания воздушного промежутка. Такой подход уменьшает неопределенность измерений и позволяет проводить калибровку без привлечения сложных компенсирующих измерений.</p></sec><sec><title>   Основные результаты</title><p>   Основные результаты. Проведенные эксперименты подтвердили, что предложенный метод снижает неопределенность измерений минимум на два порядка по сравнению с традиционными подходами. Эффективность метода продемонстрирована на конкретных примерах, которые показали преимущества метода при исследовании источников света и измерениях спектральной чувствительности приборов.</p></sec><sec><title>   Обсуждение</title><p>   Обсуждение. Новизна предложенного подхода состоит в устранении основного источника неопределенности (учета спектрального пропускания атмосферы), что кардинально улучшает метрологические показатели калибровки. Предложенный метод эффективен практически во всех прикладных ситуациях и обеспечивает существенное повышение точности измерений. По сравнению с классическими решениями, метод проще реализуется технически и дает значительно лучшие результаты в области дистанционной оптической разведки, медицины, сельского хозяйства и экологии.</p></sec></abstract><trans-abstract xml:lang="en"><p>   The paper deals with the issues of energy calibration and precise measurements of the spectral characteristics of optoelectronic systems elements designed for the analysis of radiation from remote objects. Modern calibration methods require the consideration of environmental variables, particularly in the infrared spectrum range. This leads to significant measurement errors and creates difficulties during ground-based tests. The complication of compensating for atmospheric effects, the low accuracy, and the labor-intensive nature of their consideration when using traditional techniques result in significant errors and reduce the quality of the obtained data. The proposed approach is based on the use of narrow-spectrum emitters located directly in front of the instrument input port, eliminating the need to account for atmospheric spectral transmission. Instead of traditional methods based on the use of standard sources, such as “black bodies” or photodetectors that have to take into account the transmission of the air gap, it is proposed to use a series of narrow-spectrum (spectral-zone) radiation fluxes as a calibration emitter that affects the testing optical-electronic system directly in its input window plane, which allows to provide the direct measurement of the spectral characteristics of the elements under study, bypassing the step of determining the transmission of the air gap. This approach reduces the measurements uncertainty and allows carrying out calibration without the need for complex compensating measurements. The conducted experiments confirmed that the proposed method reduces the measurement uncertainty by at least two orders of magnitude compared to traditional approaches. The effectiveness of the method is demonstrated through specific examples that show the advantages of the method in the study of light sources and measurements of the spectral sensitivity of instruments. The novelty of the proposed approach is the elimination of the main source of uncertainty (accounting for the spectral transmission of the atmosphere), which significantly improves the metrological performance of calibration. The proposed method is effective in almost all application situations and provides a significant increase in measurement accuracy. Compared to classical solutions, this method is easier to implement technically and it provides significantly better results in the fields of remote optical reconnaissance, medicine, agriculture, and ecology.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>спектрофотометрия</kwd><kwd>оптико-электронная система</kwd><kwd>спектральные характеристики</kwd><kwd>энергетическая калибровка</kwd><kwd>инфракрасный диапазон</kwd><kwd>калибровка</kwd><kwd>излучение удаленных объектов</kwd><kwd>черное тело</kwd><kwd>системы обнаружения</kwd><kwd>спектральный анализ</kwd></kwd-group><kwd-group xml:lang="en"><kwd>spectrophotometry</kwd><kwd>optoelectronic system</kwd><kwd>spectral characteristics</kwd><kwd>energy calibration</kwd><kwd>infrared range</kwd><kwd>remote object radiation</kwd><kwd>black body</kwd><kwd>detection systems</kwd><kwd>spectral analysis</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Григорьев А.В., Демин А.В., Сечак Е.Н. 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