Innovative method for measuring and calculating spectral characteristics of selective elements in optoelectronic systems
https://doi.org/10.17586/2226-1494-2025-25-6-1024-1032
Abstract
The paper deals with the issues of energy calibration and precise measurements of the spectral characteristics of optoelectronic systems elements designed for the analysis of radiation from remote objects. Modern calibration methods require the consideration of environmental variables, particularly in the infrared spectrum range. This leads to significant measurement errors and creates difficulties during ground-based tests. The complication of compensating for atmospheric effects, the low accuracy, and the labor-intensive nature of their consideration when using traditional techniques result in significant errors and reduce the quality of the obtained data. The proposed approach is based on the use of narrow-spectrum emitters located directly in front of the instrument input port, eliminating the need to account for atmospheric spectral transmission. Instead of traditional methods based on the use of standard sources, such as “black bodies” or photodetectors that have to take into account the transmission of the air gap, it is proposed to use a series of narrow-spectrum (spectral-zone) radiation fluxes as a calibration emitter that affects the testing optical-electronic system directly in its input window plane, which allows to provide the direct measurement of the spectral characteristics of the elements under study, bypassing the step of determining the transmission of the air gap. This approach reduces the measurements uncertainty and allows carrying out calibration without the need for complex compensating measurements. The conducted experiments confirmed that the proposed method reduces the measurement uncertainty by at least two orders of magnitude compared to traditional approaches. The effectiveness of the method is demonstrated through specific examples that show the advantages of the method in the study of light sources and measurements of the spectral sensitivity of instruments. The novelty of the proposed approach is the elimination of the main source of uncertainty (accounting for the spectral transmission of the atmosphere), which significantly improves the metrological performance of calibration. The proposed method is effective in almost all application situations and provides a significant increase in measurement accuracy. Compared to classical solutions, this method is easier to implement technically and it provides significantly better results in the fields of remote optical reconnaissance, medicine, agriculture, and ecology.
About the Authors
A. V. IlinskiiRussian Federation
Alexander V. Ilinskii, Vice-Director at the Center
Scientific Educational Center “ITMO University History Museum”
197101; Saint Petersburg
N. K. Maltseva
Russian Federation
Nadezhda K. Maltseva, PhD, Director at the Center
Scientific Educational Center “ITMO University History Museum”
197101; Saint Petersburg
sc 51564440800
E. O. Raskin
Russian Federation
Eugene O. Raskin, Director for Youth Policy
197101; Saint Petersburg
sc 57190605879
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Review
For citations:
Ilinskii A.V., Maltseva N.K., Raskin E.O. Innovative method for measuring and calculating spectral characteristics of selective elements in optoelectronic systems. Scientific and Technical Journal of Information Technologies, Mechanics and Optics. 2025;25(6):1024-1032. (In Russ.) https://doi.org/10.17586/2226-1494-2025-25-6-1024-1032































