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Scientific and Technical Journal of Information Technologies, Mechanics and Optics

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Vasilkova E.I., Pirogov E.V., Sobolev M.S., Baranov A.I., Gudovskikh A.S., Bouravleuv A.D. Determination of the electron distribution in thin barrier AlGaAs/GaAs superlattices by capacitance-voltage profiling. Scientific and Technical Journal of Information Technologies, Mechanics and Optics. 2022;22(6):1092-1097. (In Russ.) https://doi.org/10.17586/2226-1494-2022-22-6-1092-1097



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ISSN 2226-1494 (Print)
ISSN 2500-0373 (Online)